| |
| 2003 | ||
|---|---|---|
| 1 | EE | G. Coquery, G. Lefranc, T. Licht, R. Lallemand, N. Seliger, H. Berg: High temperature reliability on automotive power modules verified by power cycling tests up to 150degreeC. Microelectronics Reliability 43(9-11): 1871-1876 (2003) |
| 1 | H. Berg | [1] |
| 2 | G. Coquery | [1] |
| 3 | G. Lefranc | [1] |
| 4 | T. Licht | [1] |
| 5 | N. Seliger | [1] |