W. Kanert

2006
2	EE	M. Goroll, W. Kanert, R. Pufall: ESD protection structure qualification - a new approach for release for automotive applications. Microelectronics Reliability 46(9-11): 1648-1651 (2006)
2003
1	EE	W. Kanert, H. Dettmer, B. Plikat, N. Seliger: Reliability aspects of semiconductor devices in high temperature applications. Microelectronics Reliability 43(9-11): 1839-1846 (2003)

Coauthor Index

1	H. Dettmer	[1]
2	M. Goroll	[2]
3	B. Plikat	[1]
4	R. Pufall	[2]
5	N. Seliger	[1]

Colors in the list of coauthors