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T. Licht

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2006
4EEP. Zimprich, T. Licht, B. Weiss: A new method to characterize the thermomechanical response of multilayered structures in power electronics. Microelectronics Reliability 46(9-11): 1844-1847 (2006)
2003
3EEG. Coquery, G. Lefranc, T. Licht, R. Lallemand, N. Seliger, H. Berg: High temperature reliability on automotive power modules verified by power cycling tests up to 150degreeC. Microelectronics Reliability 43(9-11): 1871-1876 (2003)
2002
2EEN. Seliger, E. Wolfgang, G. Lefranc, H. Berg, T. Licht: Reliable power electronics for automotive applications. Microelectronics Reliability 42(9-11): 1597-1604 (2002)
1EEG. Lefranc, T. Licht, G. Mitic: Properties of solders and their fatigue in power modules. Microelectronics Reliability 42(9-11): 1641-1646 (2002)

Coauthor Index

1H. Berg [2] [3]
2G. Coquery [3]
3R. Lallemand [3]
4G. Lefranc [1] [2] [3]
5G. Mitic [1]
6N. Seliger [2] [3]
7B. Weiss [4]
8E. Wolfgang [2]
9P. Zimprich [4]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)