| |
| 2006 | ||
|---|---|---|
| 2 | EE | Alberto Castellazzi, Martin Honsberg-Riedl, Gerhard K. M. Wachutka: Thermal characterisation of power devices during transient operation. Microelectronics Journal 37(2): 145-151 (2006) |
| 2003 | ||
| 1 | EE | Alberto Castellazzi, V. Kartal, R. Kraus, N. Seliger, Martin Honsberg-Riedl, Doris Schmitt-Landsiedel: Hot-Spot Meaurements and Analysis of Electro-Thermal Effects in Low-Voltage Power-MOSFET's. Microelectronics Reliability 43(9-11): 1877-1882 (2003) |
| 1 | Alberto Castellazzi | [1] [2] |
| 2 | V. Kartal | [1] |
| 3 | R. Kraus | [1] |
| 4 | Doris Schmitt-Landsiedel | [1] |
| 5 | N. Seliger | [1] |
| 6 | Gerhard K. M. Wachutka | [2] |