H. Dettmer
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2003
1
EE
W. Kanert
, H. Dettmer,
B. Plikat
,
N. Seliger
: Reliability aspects of semiconductor devices in high temperature applications.
Microelectronics Reliability 43
(9-11): 1839-1846 (2003)
Coauthor
Index
1
W. Kanert
[
1
]
2
B. Plikat
[
1
]
3
N. Seliger
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
