| |
| 2003 | ||
|---|---|---|
| 2 | EE | Alberto Castellazzi, V. Kartal, R. Kraus, N. Seliger, Martin Honsberg-Riedl, Doris Schmitt-Landsiedel: Hot-Spot Meaurements and Analysis of Electro-Thermal Effects in Low-Voltage Power-MOSFET's. Microelectronics Reliability 43(9-11): 1877-1882 (2003) |
| 2002 | ||
| 1 | EE | Alberto Castellazzi, R. Kraus, N. Seliger, Doris Schmitt-Landsiedel: Reliability analysis of power MOSFET's with the help of compact models and circuit simulation. Microelectronics Reliability 42(9-11): 1605-1610 (2002) |
| 1 | Alberto Castellazzi | [1] [2] |
| 2 | Martin Honsberg-Riedl | [2] |
| 3 | V. Kartal | [2] |
| 4 | Doris Schmitt-Landsiedel | [1] [2] |
| 5 | N. Seliger | [1] [2] |