Vijay Reddy

2006
3	EE	Charvaka Duvvury, Robert Steinhoff, Gianluca Boselli, Vijay Reddy, Hans Kunz, Steve Marum, Roger Cline: Gate oxide failures due to anomalous stress from HBM ESD testers. Microelectronics Reliability 46(5-6): 656-665 (2006)
2005
2	EE	Vijay Reddy, Anand T. Krishnan, Andrew Marshall, John Rodriguez, Sreedhar Natarajan, Tim Rost, Srikanth Krishnan: Impact of negative bias temperature instability on digital circuit reliability. Microelectronics Reliability 45(1): 31-38 (2005)
2004
1	EE	Vijay Reddy, John Carulli, Anand T. Krishnan, William Bosch, Brendan Burgess: Impact of Negative Bias Temperature Instability on Product Parametric Drift. ITC 2004: 148-155

Coauthor Index

1	William Bosch	[1]
2	Gianluca Boselli	[3]
3	Brendan Burgess	[1]
4	John Carulli	[1]
5	Roger Cline	[3]
6	Charvaka Duvvury	[3]
7	Anand T. Krishnan	[1] [2]
8	Srikanth Krishnan	[2]
9	Hans Kunz	[3]
10	Andrew Marshall	[2]
11	Steve Marum	[3]
12	Sreedhar Natarajan	[2]
13	John Rodriguez	[2]
14	Tim Rost	[2]
15	Robert Steinhoff	[3]

Colors in the list of coauthors