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Hans Kunz

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2006
1EECharvaka Duvvury, Robert Steinhoff, Gianluca Boselli, Vijay Reddy, Hans Kunz, Steve Marum, Roger Cline: Gate oxide failures due to anomalous stress from HBM ESD testers. Microelectronics Reliability 46(5-6): 656-665 (2006)

Coauthor Index

1Gianluca Boselli [1]
2Roger Cline [1]
3Charvaka Duvvury [1]
4Steve Marum [1]
5Vijay Reddy [1]
6Robert Steinhoff [1]

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