| |
| 2006 | ||
|---|---|---|
| 1 | EE | Charvaka Duvvury, Robert Steinhoff, Gianluca Boselli, Vijay Reddy, Hans Kunz, Steve Marum, Roger Cline: Gate oxide failures due to anomalous stress from HBM ESD testers. Microelectronics Reliability 46(5-6): 656-665 (2006) |
| 1 | Gianluca Boselli | [1] |
| 2 | Roger Cline | [1] |
| 3 | Charvaka Duvvury | [1] |
| 4 | Hans Kunz | [1] |
| 5 | Vijay Reddy | [1] |
| 6 | Robert Steinhoff | [1] |