| 2006 |
|---|
| 3 | EE | Charvaka Duvvury,
Robert Steinhoff,
Gianluca Boselli,
Vijay Reddy,
Hans Kunz,
Steve Marum,
Roger Cline:
Gate oxide failures due to anomalous stress from HBM ESD testers.
Microelectronics Reliability 46(5-6): 656-665 (2006) |
| 2004 |
|---|
| 2 | EE | Jorge Salcedo-Suñer,
Charvaka Duvvury,
Roger Cline,
Alfonso Cadena-Hernandez:
Latchup in voltage tolerant circuits: a new phenomenon.
Microelectronics Reliability 44(4): 549-562 (2004) |
| 2002 |
|---|
| 1 | EE | Craig Salling,
Jerry Hu,
Jeff Wu,
Charvaka Duvvury,
Roger Cline,
Rith Pok:
Development of substrate-pumped nMOS protection for a 0.13 mum technology.
Microelectronics Reliability 42(6): 887-899 (2002) |
