| 2005 |
|---|
| 4 | EE | Vijay Reddy,
Anand T. Krishnan,
Andrew Marshall,
John Rodriguez,
Sreedhar Natarajan,
Tim Rost,
Srikanth Krishnan:
Impact of negative bias temperature instability on digital circuit reliability.
Microelectronics Reliability 45(1): 31-38 (2005) |
| 2003 |
|---|
| 3 | EE | W. Lewis Johnson,
Erin Shaw,
Andrew Marshall,
Catherine LaBore:
Evolution of user interaction: the case of agent adele.
IUI 2003: 93-100 |
| 2002 |
|---|
| 2 | EE | Andrew Marshall:
Quality Aspects of SOI Circuit Design (Tutorial Abstract).
ISQED 2002: 13 |
| 1995 |
|---|
| 1 | | Joe Devore,
Andrew Marshall,
Tim McCoy:
Power IC Design for Testability.
ISCAS 1995: 1496-1499 |
