| |
| 2005 | ||
|---|---|---|
| 1 | EE | Vijay Reddy, Anand T. Krishnan, Andrew Marshall, John Rodriguez, Sreedhar Natarajan, Tim Rost, Srikanth Krishnan: Impact of negative bias temperature instability on digital circuit reliability. Microelectronics Reliability 45(1): 31-38 (2005) |
| 1 | Anand T. Krishnan | [1] |
| 2 | Srikanth Krishnan | [1] |
| 3 | Andrew Marshall | [1] |
| 4 | Sreedhar Natarajan | [1] |
| 5 | Vijay Reddy | [1] |
| 6 | Tim Rost | [1] |