| |
| 2004 | ||
|---|---|---|
| 1 | EE | Vijay Reddy, John Carulli, Anand T. Krishnan, William Bosch, Brendan Burgess: Impact of Negative Bias Temperature Instability on Product Parametric Drift. ITC 2004: 148-155 |
| 1 | William Bosch | [1] |
| 2 | John Carulli | [1] |
| 3 | Anand T. Krishnan | [1] |
| 4 | Vijay Reddy | [1] |