| |
| 2005 | ||
|---|---|---|
| 1 | EE | D. Abessolo-Bidzo, P. Poirier, Ph. Descamps, B. Domengès: Isolating failing sites in IC packages using time domain reflectometry: Case studies. Microelectronics Reliability 45(9-11): 1639-1644 (2005) |
| 1 | Ph. Descamps | [1] |
| 2 | B. Domengès | [1] |
| 3 | P. Poirier | [1] |