| |
| 2002 | ||
|---|---|---|
| 1 | EE | B. Domengès, P. Schwindenhammer, P. Poirier, Felix Beaudoin, Ph. Descamps: Comprehensive failure analysis of leakage faults in bipolar transistors. Microelectronics Reliability 42(9-11): 1449-1452 (2002) |
| 1 | Felix Beaudoin | [1] |
| 2 | Ph. Descamps | [1] |
| 3 | B. Domengès | [1] |
| 4 | P. Poirier | [1] |