P. R. Mukund
List of publications from the
2007 |
23 | EE | Tejasvi Das,
P. R. Mukund:
Sensitivity analysis for fault-analysis and tolerance in RF front-end circuitry.
DATE 2007: 1277-1282 |
2006 |
22 | EE | S. Sridharan,
Sripriya R. Bandi,
Clyde Washburn,
Ponnathpur R. Mukund,
Jan Kolnik,
Ken Paradis,
Steve Howard,
Jeff Burleson:
A universal common-source and common-drain model for 1-20GHz frequency range.
ISCAS 2006 |
21 | EE | Mark Pude,
Clyde Washburn,
Ponnathpur R. Mukund,
Kouichi Abe,
Yoshinori Nishi:
An analytical propagation delay model with power supply noise effects.
ISCAS 2006 |
20 | EE | Tejasvi Das,
Ponnathpur R. Mukund:
Self-calibration of gain and output match in LNAs.
ISCAS 2006 |
19 | EE | Tejasvi Das,
Anand Gopalan,
Clyde Washburn,
P. R. Mukund:
Towards Fault-Tolerant RF Front Ends.
J. Electronic Testing 22(4-6): 371-386 (2006) |
2005 |
18 | EE | Anand Gopalan,
Tejasvi Das,
Clyde Washburn,
Ponnathpur R. Mukund:
Use of source degeneration for non-intrusive BIST of RF front-end circuits.
ISCAS (5) 2005: 4385-4388 |
17 | EE | Sripriya R. Bandi,
Clyde Washburn,
P. R. Mukund,
Jan Kolnik,
Minxuan Liu,
Ken Paradis,
Steve Howard,
Jeff Burleson:
Accurate performance prediction of multi-GHz CML with data run-length variations.
ISCAS (5) 2005: 5103-5106 |
16 | EE | Tejasvi Das,
Clyde Washburn,
P. R. Mukund,
Steve Howard,
Ken Paradis,
Jung-Geau Jang,
Jan Kolnik,
Jeff Burleson:
Effects of Technology and Dimensional Scaling on Input Loss Prediction of RF MOSFETs.
VLSI Design 2005: 295-300 |
15 | EE | Anand Gopalan,
Tejasvi Das,
Clyde Washburn,
P. R. Mukund:
An Ultra-Fast, On-Chip BiST for RF Low Noise Amplifiers.
VLSI Design 2005: 485-490 |
14 | EE | Ghanshyam Nayak,
Clyde Washburn,
P. R. Mukund:
System in a Package Design of a RF Front End System Using Application Specific Reduced Order Models.
VLSI Design 2005: 878-881 |
13 | EE | Anand Gopalan,
Martin Margala,
P. R. Mukund:
A current based self-test methodology for RF front-end circuits.
Microelectronics Journal 36(12): 1091-1102 (2005) |
2004 |
12 | EE | Tejasvi Das,
Anand Gopalan,
Clyde Washburn,
P. R. Mukund:
Dynamic Input Match Correction in RF Low Noise Amplifiers.
DFT 2004: 211-219 |
11 | EE | Ghanshyam Nayak,
Tejasvi Das,
T. M. Rao,
P. R. Mukund:
DREAM: A Chip-Package Co-Design Tool for RF-Mixed Signal Systems.
ISVLSI 2004: 207-210 |
10 | EE | Antonija Soldo,
Anand Gopalan,
P. R. Mukund,
Martin Margala:
A Current Sensor for On-Chip, Non-Intrusive Testing of RF Systems.
VLSI Design 2004: 1023-1026 |
9 | EE | Ghanshyam Nayak,
P. R. Mukund:
Chip Package Co-Design of a Heterogeneously Integrated 2.45GHz CMOS VCO using Embedded Passives in a Silicon Package.
VLSI Design 2004: 627-630 |
8 | EE | M. Benmansour,
P. R. Mukund:
A Tuned Wideband LNA in 0.25?I`m IBM Process For RF Communication Applications.
VLSI Design 2004: 631-634 |
7 | EE | Tejasvi Das,
P. R. Mukund:
A Low Noise Current-mode Readout circuit for CMOS Image Sensing Applications.
VLSI Design 2004: 635-638 |
2003 |
6 | EE | S. Sridharan,
Ghanshyam Nayak,
P. R. Mukund:
LNA design optimization with reference to ESD protection circuitry.
ISCAS (1) 2003: 205-208 |
5 | EE | Rajesh Narasimha,
S. B. Rachaiah,
Raghuveer M. Rao,
P. R. Mukund:
1/f noise modeling using discrete-time self-similar systems.
ISCAS (4) 2003: 596-599 |
2002 |
4 | EE | H. Parthasarathy,
Ghanshyam Nayak,
Ponnathpur R. Mukund:
Analysis of VCO jitter in chip-package co-design.
ISCAS (3) 2002: 181-184 |
1995 |
3 | EE | George A. Hadgis,
P. R. Mukund:
A novel CMOS monolithic analog multiplier with wide input dynamic range.
VLSI Design 1995: 310-314 |
1993 |
2 | | P. R. Mukund,
V. Mukund,
Charles E. Noon:
Signal Routing with Temporal Constraints.
ISCAS 1993: 1479-1482 |
1 | | P. R. Mukund,
J. F. McDonald:
MCM: The High-Performance Electronic Packaging Technology.
IEEE Computer 26(4): 10-12 (1993) |