| 2008 |
|---|
| 5 | EE | Shengnan Xu,
Baozhen Li,
Yanhua Shao:
Neural Network Approach Based on Agent to Predict Stock Performance.
CSSE (1) 2008: 1223-1225 |
| 2006 |
|---|
| 4 | EE | Baozhen Li,
Emmanuel Yashchin,
Cathryn Christiansen,
Jason Gill,
Ronald Filippi,
Timothy D. Sullivan:
Application of three-parameter lognormal distribution in EM data analysis.
Microelectronics Reliability 46(12): 2049-2055 (2006) |
| 2004 |
|---|
| 3 | | Baozhen Li,
Nana Li,
Xianfeng Liu:
Transformation & Countermeasures on Business Operation Models in Uncertain Environment.
ICEB 2004: 1001-1003 |
| 2 | EE | Baozhen Li,
Timothy D. Sullivan,
Tom C. Lee,
Dinesh Badami:
Reliability challenges for copper interconnects.
Microelectronics Reliability 44(3): 365-380 (2004) |
| 2002 |
|---|
| 1 | EE | Fen Chen,
Rolf-Peter Vollertsen,
Baozhen Li,
Dave Harmon,
Wing L. Lai:
A new empirical extrapolation method for time-dependent dielectric breakdown reliability projections of thin SiO2 and nitride-oxide dielectrics.
Microelectronics Reliability 42(3): 335-341 (2002) |
