| 2007 |
|---|
| 5 | EE | Emmanuel Yashchin:
Modeling of risk losses using size-biased data.
IBM Journal of Research and Development 51(3/4): 309-324 (2007) |
| 2006 |
|---|
| 4 | EE | Baozhen Li,
Emmanuel Yashchin,
Cathryn Christiansen,
Jason Gill,
Ronald Filippi,
Timothy D. Sullivan:
Application of three-parameter lognormal distribution in EM data analysis.
Microelectronics Reliability 46(12): 2049-2055 (2006) |
| 2003 |
|---|
| 3 | EE | Mary Y. L. Wisniewski,
Emmanuel Yashchin,
Robert L. Franch,
David P. Conrady,
Giovanni Fiorenza,
I. Cevdet Noyan:
Estimating the efficiency of collaborative problem-solving, with applications to chip design.
IBM Journal of Research and Development 47(1): 77-88 (2003) |
| 2 | EE | Mary Y. L. Wisniewski,
Emmanuel Yashchin,
Robert L. Franch,
David P. Conrady,
Daniel N. Maynard,
Giovanni Fiorenza,
I. Cevdet Noyan:
The physical design of on-chip interconnections.
IEEE Trans. on CAD of Integrated Circuits and Systems 22(3): 254-276 (2003) |
| 1985 |
|---|
| 1 | | Emmanuel Yashchin:
On the Analysis and Design of CUSUM-Shewhart Control Schemes.
IBM Journal of Research and Development 29(4): 377-391 (1985) |
