| |
| 2006 | ||
|---|---|---|
| 2 | EE | Baozhen Li, Emmanuel Yashchin, Cathryn Christiansen, Jason Gill, Ronald Filippi, Timothy D. Sullivan: Application of three-parameter lognormal distribution in EM data analysis. Microelectronics Reliability 46(12): 2049-2055 (2006) |
| 2003 | ||
| 1 | EE | Harry A. Schafft, Linda M. Head, Jason Gill, Timothy D. Sullivan: Early reliability assessment by using deep censoring. Microelectronics Reliability 43(1): 1-16 (2003) |
| 1 | Cathryn Christiansen | [2] |
| 2 | Ronald Filippi | [2] |
| 3 | Linda M. Head | [1] |
| 4 | Baozhen Li | [2] |
| 5 | Harry A. Schafft | [1] |
| 6 | Timothy D. Sullivan | [1] [2] |
| 7 | Emmanuel Yashchin | [2] |