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Rolf-Peter Vollertsen

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2005
5EERolf-Peter Vollertsen, Enrique Miranda: The TDDB power-law model - Physics and experimental evidences. Microelectronics Reliability 45(12): 1807-1808 (2005)
4EERainer Duschl, Rolf-Peter Vollertsen: Is the power-law model applicable beyond the direct tunneling regime? Microelectronics Reliability 45(12): 1861-1867 (2005)
2004
3EERolf-Peter Vollertsen: Fast wafer level reliability: methods and experiences. Microelectronics Reliability 44(8): 1207-1208 (2004)
2EEAndreas Martin, Rolf-Peter Vollertsen: An introduction to fast wafer level reliability monitoring for integrated circuit mass production. Microelectronics Reliability 44(8): 1209-1231 (2004)
2002
1EEFen Chen, Rolf-Peter Vollertsen, Baozhen Li, Dave Harmon, Wing L. Lai: A new empirical extrapolation method for time-dependent dielectric breakdown reliability projections of thin SiO2 and nitride-oxide dielectrics. Microelectronics Reliability 42(3): 335-341 (2002)

Coauthor Index

1Fen Chen [1]
2Rainer Duschl [4]
3Dave Harmon [1]
4Wing L. Lai [1]
5Baozhen Li [1]
6Andreas Martin [2]
7Enrique Miranda [5]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)