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| 2002 | ||
|---|---|---|
| 1 | EE | Fen Chen, Rolf-Peter Vollertsen, Baozhen Li, Dave Harmon, Wing L. Lai: A new empirical extrapolation method for time-dependent dielectric breakdown reliability projections of thin SiO2 and nitride-oxide dielectrics. Microelectronics Reliability 42(3): 335-341 (2002) |
| 1 | Dave Harmon | [1] |
| 2 | Wing L. Lai | [1] |
| 3 | Baozhen Li | [1] |
| 4 | Rolf-Peter Vollertsen | [1] |