Dinesh Badami
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2004
1
EE
Baozhen Li
,
Timothy D. Sullivan
,
Tom C. Lee
, Dinesh Badami: Reliability challenges for copper interconnects.
Microelectronics Reliability 44
(3): 365-380 (2004)
Coauthor
Index
1
Tom C. Lee
[
1
]
2
Baozhen Li
[
1
]
3
Timothy D. Sullivan
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
