Tom C. Lee
List of publications from the
DBLP Bibliography Server
-
FAQ
Coauthor Index
- Ask others: ACM
DL
/
Guide
-
CiteSeer
-
CSB
-
Google
-
MSN
-
Yahoo
2004
1
EE
Baozhen Li
,
Timothy D. Sullivan
, Tom C. Lee,
Dinesh Badami
: Reliability challenges for copper interconnects.
Microelectronics Reliability 44
(3): 365-380 (2004)
Coauthor
Index
1
Dinesh Badami
[
1
]
2
Baozhen Li
[
1
]
3
Timothy D. Sullivan
[
1
]
Copyright ©
Sun May 17 03:24:02 2009 by
Michael Ley
(
ley@uni-trier.de
)
