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| 2003 | ||
|---|---|---|
| 1 | EE | P. Soussan, G. Lekens, R. Dreesen, Ward De Ceuninck, E. Beyne: Advantage of In-situ over Ex-situ techniques as reliability tool: Aging kinetics of Imec's MCM-D discrete passives devices. Microelectronics Reliability 43(9-11): 1785-1790 (2003) |
| 1 | E. Beyne | [1] |
| 2 | Ward De Ceuninck | [1] |
| 3 | R. Dreesen | [1] |
| 4 | G. Lekens | [1] |