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P. Soussan

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2003
1EEP. Soussan, G. Lekens, R. Dreesen, Ward De Ceuninck, E. Beyne: Advantage of In-situ over Ex-situ techniques as reliability tool: Aging kinetics of Imec's MCM-D discrete passives devices. Microelectronics Reliability 43(9-11): 1785-1790 (2003)

Coauthor Index

1E. Beyne [1]
2Ward De Ceuninck [1]
3R. Dreesen [1]
4G. Lekens [1]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)