E. Beyne

2006
2	EE	K. Baert, Bert Gyselinckx, T. Torfs, V. Leonov, F. Yazicioglu, S. Brebels, S. Donnay, J. Vanfletern, M. Pastreen, E. Beyne, C. Van Hoof: Technologies for highly miniaturized autonomous sensor networks. Microelectronics Journal 37(12): 1563-1568 (2006)
2003
1	EE	P. Soussan, G. Lekens, R. Dreesen, Ward De Ceuninck, E. Beyne: Advantage of In-situ over Ex-situ techniques as reliability tool: Aging kinetics of Imec's MCM-D discrete passives devices. Microelectronics Reliability 43(9-11): 1785-1790 (2003)

Coauthor Index

1	K. Baert	[2]
2	S. Brebels	[2]
3	Ward De Ceuninck	[1]
4	S. Donnay	[2]
5	R. Dreesen	[1]
6	Bert Gyselinckx	[2]
7	C. Van Hoof	[2]
8	G. Lekens	[1]
9	V. Leonov	[2]
10	M. Pastreen	[2]
11	P. Soussan	[1]
12	T. Torfs	[2]
13	J. Vanfletern	[2]
14	F. Yazicioglu	[2]

Colors in the list of coauthors