| 2008 |
|---|
| 4 | EE | Gert Jervan,
Elmet Orasson,
Helena Kruus,
Raimund Ubar:
Hybrid BIST optimization using reseeding and test set compaction.
Microprocessors and Microsystems - Embedded Hardware Design 32(5-6): 254-262 (2008) |
| 2007 |
|---|
| 3 | EE | Gert Jervan,
Elmet Orasson,
Helena Kruus,
Raimund Ubar:
Hybrid BIST Optimization Using Reseeding and Test Set Compaction.
DSD 2007: 596-603 |
| 2 | EE | Gert Jervan,
Helena Kruus,
Elmet Orasson,
Raimund Ubar:
Optimization of Memory-Constrained Hybrid BIST for Testing Core-Based Systems.
SIES 2007: 71-77 |
| 2001 |
|---|
| 1 | EE | Elmet Orasson,
Rein Raidma,
Raimund Ubar,
Gert Jervan,
Zebo Peng:
Fast Test Cost Calculation for Hybrid BIST in Digital Systems.
DSD 2001: 318-325 |
