2008 |
4 | EE | Gert Jervan,
Elmet Orasson,
Helena Kruus,
Raimund Ubar:
Hybrid BIST optimization using reseeding and test set compaction.
Microprocessors and Microsystems - Embedded Hardware Design 32(5-6): 254-262 (2008) |
2007 |
3 | EE | Gert Jervan,
Elmet Orasson,
Helena Kruus,
Raimund Ubar:
Hybrid BIST Optimization Using Reseeding and Test Set Compaction.
DSD 2007: 596-603 |
2 | EE | Gert Jervan,
Helena Kruus,
Elmet Orasson,
Raimund Ubar:
Optimization of Memory-Constrained Hybrid BIST for Testing Core-Based Systems.
SIES 2007: 71-77 |
2002 |
1 | EE | Gert Jervan,
Zebo Peng,
Raimund Ubar,
Helena Kruus:
A Hybrid BIST Architecture and Its Optimization for SoC Testing.
ISQED 2002: 273-279 |