| 2007 |
|---|
| 28 | EE | Chii-Ruey Lin,
Pei-Shu Fan,
Yea-Jou Shiau,
MuDer Jeng:
An Agent-Based Early Manufacturability Assessment for Collaborative Design in Coating Process.
KES (2) 2007: 649-655 |
| 27 | EE | YuanLin Wen,
Sheng-Luen Chung,
Li-Der Jeng,
MuDer Jeng:
Intelligent Design of Diagnosable Systems: A Case Study of Semiconductor Manufacturing Machines.
KES (2) 2007: 877-884 |
| 26 | EE | YuanLin Wen,
Pei-Shu Fan,
MuDer Jeng:
Diagnosable discrete event systems design.
SMC 2007: 1357-1362 |
| 25 | EE | Da-Yin Liao,
MuDer Jeng,
MengChu Zhou:
Application of Petri Nets and Lagrangian Relaxation to Scheduling Automatic Material-Handling Vehicles in 300-mm Semiconductor Manufacturing.
IEEE Transactions on Systems, Man, and Cybernetics, Part C 37(4): 504-516 (2007) |
| 2006 |
|---|
| 24 | EE | YuanLin Wen,
MuDer Jeng,
Li-Der Jeng,
Pei-Shu Fan:
An Intelligent Technique Based on Petri Nets for Diagnosability Enhancement of Discrete Event Systems.
KES (2) 2006: 879-887 |
| 2005 |
|---|
| 23 | | Chuan-Yu Chang,
Jia-Wei Chang,
MuDer Jeng:
An Unsupervised Self-Organizing Neural Network for Automatic Semiconductor Wafer Defect Inspection.
ICRA 2005: 3000-3005 |
| 22 | EE | Chang-Pin Lin,
Li-Der Jeng,
Yi-Ping Lin,
MuDer Jeng:
Management and control of information flow in CIM systems using UML and Petri nets.
Int. J. Computer Integrated Manufacturing 18(2&3): 107-121 (2005) |
| 21 | EE | Chung-Hsien Kuo,
Han-Pang Huang,
MuDer Jeng,
Li-Der Jeng:
Separation model design of manufacturing systems using the distributed agent-oriented Petri net.
Int. J. Computer Integrated Manufacturing 18(2&3): 146-157 (2005) |
| 20 | EE | MuDer Jeng,
Xiaolan Xie:
Discrete event system techniques for CIM: guest editorial.
Int. J. Computer Integrated Manufacturing 18(2&3): 97-99 (2005) |
| 2004 |
|---|
| 19 | EE | Da-Yin Liao,
MuDer Jeng,
MengChu Zhou:
Petri Net Modeling and Lagrangian Relaxation Approach to Vehicle Scheduling in 300 mm Semiconductor Manufacturing.
ICRA 2004: 5301-5306 |
| 18 | EE | Chuan-Yu Chang,
Jia-Wei Chang,
MuDer Jeng:
Using a self-organizing neural network for wafer defect inspection.
SMC (5) 2004: 4312-4317 |
| 17 | EE | YuanLin Wen,
MuDer Jeng:
Diagnosability of Petri nets.
SMC (5) 2004: 4891-4896 |
| 16 | EE | MuDer Jeng,
Xiaolan Xie,
Sheng-Luen Chung:
ERCN* merged nets for modeling degraded behavior and parallel processes in semiconductor manufacturing systems.
IEEE Transactions on Systems, Man, and Cybernetics, Part A 34(1): 102-112 (2004) |
| 2003 |
|---|
| 15 | | MuDer Jeng,
Xiaolan Xie,
Sheng-Luen Chung:
ERCN merged nets for modeling degraded behavior and parallel processes in semiconductor manufacturing systems.
ICRA 2003: 1033-1038 |
| 14 | | Sheng-Luen Chung,
MuDer Jeng:
AN overview of semiconductor fab automation systems.
ICRA 2003: 1050-1055 |
| 2002 |
|---|
| 13 | | YiSheng Huang,
MuDer Jeng,
YuanLin Wen:
Analysis of a Siphon-Based Deadlock Prevention Policy for Flexible Manufacturing Systems.
ICRA 2002: 2327-2332 |
| 12 | | Sheng-Luen Chung,
MuDer Jeng:
Normalized In-Line Stepper Coordinator Design by the Sequence Diagram and Production Rules: A Case Study.
ICRA 2002: 3169-3174 |
| 11 | | MuDer Jeng,
WeiZhao Lu:
Extension of UML and Its Conversion to Petri Nets for Semiconductor Manufacturing Modeling.
ICRA 2002: 3175-3180 |
| 2001 |
|---|
| 10 | | MuDer Jeng,
Xiaolan Xie:
Modeling and Analysis of Semiconductor Manufacturing Systems with Degraded Behaviors Using Petri Nets and Siphons.
ICRA 2001: 52-57 |
| 9 | | YiSheng Huang,
MuDer Jeng,
Xiaolan Xie,
Sheng-Luen Chung:
A Deadlock Prevention Policy for Flexible Manufacturing Systems Using Siphons.
ICRA 2001: 541-546 |
| 8 | EE | YiSheng Huang,
MuDer Jeng,
Sheng-Luen Chung:
Design, analysis and implementation of a real-world manufacturing cell controller based on Petri nets.
Int. J. Computer Integrated Manufacturing 14(3): 304-318 (2001) |
| 2000 |
|---|
| 7 | | MuDer Jeng,
Xiaolan Xie,
YiSheng Huang:
Manufacturing Modeling using Process Nets with Resources.
ICRA 2000: 2185-2190 |
| 6 | | MuDer Jeng,
Xiaolan Xie,
WenYuan Hung:
Markovian timed Petri nets for performance analysis of semiconductor manufacturing systems.
IEEE Transactions on Systems, Man, and Cybernetics, Part B 30(5): 757-771 (2000) |
| 5 | | Fan-Tien Cheng,
Haw Ching Yang,
Tsung-Liang Luo,
Chengche Feng,
MuDer Jeng:
Modeling and analysis of equipment managers in manufacturing execution systems for semiconductor packaging.
IEEE Transactions on Systems, Man, and Cybernetics, Part B 30(5): 772-782 (2000) |
| 1999 |
|---|
| 4 | | MuDer Jeng,
Mao Yu Peng:
Augmented reachability trees for 1-place-unbounded generalized Petri nets.
IEEE Transactions on Systems, Man, and Cybernetics, Part A 29(2): 173-183 (1999) |
| 3 | | MuDer Jeng,
Xiaolan Xie:
Analysis of modularly composed nets by siphons.
IEEE Transactions on Systems, Man, and Cybernetics, Part A 29(4): 399-406 (1999) |
| 1997 |
|---|
| 2 | | MuDer Jeng:
A Petri net synthesis theory for modeling flexible manufacturing systems.
IEEE Transactions on Systems, Man, and Cybernetics, Part B 27(2): 169-183 (1997) |
| 1995 |
|---|
| 1 | | Chuan-Yu Chang,
MuDer Jeng:
A Neural Network Model for the Job-Shop Sheduling Problem with the Consideration of Lots Sizes.
ICRA 1995: 202-207 |
