| 2007 |
|---|
| 5 | EE | YuanLin Wen,
Sheng-Luen Chung,
Li-Der Jeng,
MuDer Jeng:
Intelligent Design of Diagnosable Systems: A Case Study of Semiconductor Manufacturing Machines.
KES (2) 2007: 877-884 |
| 4 | EE | YuanLin Wen,
Pei-Shu Fan,
MuDer Jeng:
Diagnosable discrete event systems design.
SMC 2007: 1357-1362 |
| 2006 |
|---|
| 3 | EE | YuanLin Wen,
MuDer Jeng,
Li-Der Jeng,
Pei-Shu Fan:
An Intelligent Technique Based on Petri Nets for Diagnosability Enhancement of Discrete Event Systems.
KES (2) 2006: 879-887 |
| 2004 |
|---|
| 2 | EE | YuanLin Wen,
MuDer Jeng:
Diagnosability of Petri nets.
SMC (5) 2004: 4891-4896 |
| 2002 |
|---|
| 1 | | YiSheng Huang,
MuDer Jeng,
YuanLin Wen:
Analysis of a Siphon-Based Deadlock Prevention Policy for Flexible Manufacturing Systems.
ICRA 2002: 2327-2332 |
