2008 |
11 | EE | Shang-Chun Tsai,
Fang-Biau Ueng,
Jun-Da Chen,
Li-Der Jeng,
Jian-Wei Chen,
Kun-Da Ke:
Smart Antennas for Multi-Rate MC-CDMA Communication Systems.
VTC Spring 2008: 524-528 |
10 | EE | Chang-Ming Lee,
Yu T. Su,
Li-Der Jeng:
Performance Analysis of Block Codes in Hidden Markov Channels.
IEEE Transactions on Communications 56(1): 1-4 (2008) |
9 | EE | Li-Der Jeng,
Fang-Biau Ueng:
Anti-Interference Receiver Structures for Direct Sequence Spread Spectrum Signals.
IEICE Transactions 91-B(4): 1103-1111 (2008) |
2007 |
8 | EE | Li-Der Jeng,
Jen-Hou Huang,
Chung-Hsuan Wang:
Performance of low-density parity-check coded FFH/BFSK systems under band multitone jamming.
IWCMC 2007: 434-438 |
7 | EE | YuanLin Wen,
Sheng-Luen Chung,
Li-Der Jeng,
MuDer Jeng:
Intelligent Design of Diagnosable Systems: A Case Study of Semiconductor Manufacturing Machines.
KES (2) 2007: 877-884 |
2006 |
6 | EE | Li-Der Jeng,
Shun-Sheng Lee,
Chung-Hsuan Wang,
Fang-Biau Ueng:
Low-density parity-check codes for FFH/BFSK systems with partial-band noise jamming.
IWCMC 2006: 1213-1218 |
5 | EE | Fang-Biau Ueng,
Jun-Da Chen,
Shang-Chun Tsai,
Sheng-Fu Wang,
Hsien Su,
Li-Der Jeng:
Adaptive MC-CDMA and MC-DS-CDMA receivers for multiuser and multipath fading communications.
IWCMC 2006: 821-826 |
4 | EE | YuanLin Wen,
MuDer Jeng,
Li-Der Jeng,
Pei-Shu Fan:
An Intelligent Technique Based on Petri Nets for Diagnosability Enhancement of Discrete Event Systems.
KES (2) 2006: 879-887 |
2005 |
3 | EE | Fang-Biau Ueng,
Li-Der Jeng,
Jun-Da Chen,
Jia-Yu Yang:
Adaptive Receivers for DS/CDMA Multiuser Communication in Multipath Fading Channels.
IEICE Transactions 88-B(2): 687-697 (2005) |
2 | EE | Chang-Pin Lin,
Li-Der Jeng,
Yi-Ping Lin,
MuDer Jeng:
Management and control of information flow in CIM systems using UML and Petri nets.
Int. J. Computer Integrated Manufacturing 18(2&3): 107-121 (2005) |
1 | EE | Chung-Hsien Kuo,
Han-Pang Huang,
MuDer Jeng,
Li-Der Jeng:
Separation model design of manufacturing systems using the distributed agent-oriented Petri net.
Int. J. Computer Integrated Manufacturing 18(2&3): 146-157 (2005) |