| |
| 2005 | ||
|---|---|---|
| 2 | Chuan-Yu Chang, Jia-Wei Chang, MuDer Jeng: An Unsupervised Self-Organizing Neural Network for Automatic Semiconductor Wafer Defect Inspection. ICRA 2005: 3000-3005 | |
| 2004 | ||
| 1 | EE | Chuan-Yu Chang, Jia-Wei Chang, MuDer Jeng: Using a self-organizing neural network for wafer defect inspection. SMC (5) 2004: 4312-4317 |
| 1 | Chuan-Yu Chang | [1] [2] |
| 2 | MuDer Jeng | [1] [2] |