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2005 | ||
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2 | EE | G. Ghidini, C. Capolupo, G. Giusto, A. Sebastiani, B. Stragliati, M. Vitali: Tunnel oxide degradation under pulsed stress. Microelectronics Reliability 45(9-11): 1337-1342 (2005) |
1982 | ||
1 | Colette Rolland, M. Vitali: Transactions Modelling In Distributed Environments. ICDCS 1982: 2-6 |
1 | C. Capolupo | [2] |
2 | G. Ghidini | [2] |
3 | G. Giusto | [2] |
4 | Colette Rolland | [1] |
5 | A. Sebastiani | [2] |
6 | B. Stragliati | [2] |