| 2003 |
|---|
| 3 | EE | Xiaofang Gao,
Juin J. Liou,
Joe Bernier,
Gregg Croft,
Waisum Wong,
Satya Vishwanathan:
Optimization of on-chip ESD protection structures for minimal parasitic capacitance.
Microelectronics Reliability 43(5): 725-733 (2003) |
| 2002 |
|---|
| 2 | EE | Xiaofang Gao,
Juin J. Liou,
Joe Bernier,
Gregg Croft,
Adelmo Ortiz-Conde:
Implementation of a comprehensive and robust MOSFET model in cadence SPICE for ESD applications.
IEEE Trans. on CAD of Integrated Circuits and Systems 21(12): 1497-1502 (2002) |
| 1 | EE | Juin J. Liou,
R. Shireen,
Adelmo Ortiz-Conde,
F. J. García Sánchez,
Antonio Cerdeira,
Xiaofang Gao,
Xuecheng Zou,
C. S. Ho:
Influence of polysilicon-gate depletion on the subthreshold behavior of submicron MOSFETs.
Microelectronics Reliability 42(3): 343-347 (2002) |
