| |
| 2002 | ||
|---|---|---|
| 1 | EE | Juin J. Liou, R. Shireen, Adelmo Ortiz-Conde, F. J. García Sánchez, Antonio Cerdeira, Xiaofang Gao, Xuecheng Zou, C. S. Ho: Influence of polysilicon-gate depletion on the subthreshold behavior of submicron MOSFETs. Microelectronics Reliability 42(3): 343-347 (2002) |
| 1 | Antonio Cerdeira | [1] |
| 2 | Xiaofang Gao | [1] |
| 3 | C. S. Ho | [1] |
| 4 | Juin J. Liou | [1] |
| 5 | Adelmo Ortiz-Conde | [1] |
| 6 | F. J. García Sánchez | [1] |
| 7 | Xuecheng Zou | [1] |