2003 | ||
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1 | EE | Xiaofang Gao, Juin J. Liou, Joe Bernier, Gregg Croft, Waisum Wong, Satya Vishwanathan: Optimization of on-chip ESD protection structures for minimal parasitic capacitance. Microelectronics Reliability 43(5): 725-733 (2003) |
1 | Joe Bernier | [1] |
2 | Gregg Croft | [1] |
3 | Xiaofang Gao | [1] |
4 | Juin J. Liou | [1] |
5 | Satya Vishwanathan | [1] |