| 2006 |
|---|
| 3 | EE | F. J. García Sánchez,
Adelmo Ortiz-Conde,
J. Muci:
Understanding threshold voltage in undoped-body MOSFETs: An appraisal of various criteria.
Microelectronics Reliability 46(5-6): 731-742 (2006) |
| 2002 |
|---|
| 2 | EE | Juin J. Liou,
R. Shireen,
Adelmo Ortiz-Conde,
F. J. García Sánchez,
Antonio Cerdeira,
Xiaofang Gao,
Xuecheng Zou,
C. S. Ho:
Influence of polysilicon-gate depletion on the subthreshold behavior of submicron MOSFETs.
Microelectronics Reliability 42(3): 343-347 (2002) |
| 1 | EE | Adelmo Ortiz-Conde,
F. J. García Sánchez,
Juin J. Liou,
Antonio Cerdeira,
Magali Estrada,
Y. Yue:
A review of recent MOSFET threshold voltage extraction methods.
Microelectronics Reliability 42(4-5): 583-596 (2002) |
