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Juin J. Liou

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2007
11EEYou-Lin Wu, Shi-Tin Lin, Tsung-Min Chang, Juin J. Liou: Reliability study of ultrathin oxide films subject to irradiation-then-stress treatment using conductive atomic force microscopy. Microelectronics Reliability 47(2-3): 419-421 (2007)
2006
10EEJavier A. Salcedo, Juin J. Liou, Muhammad Yaqub Afridi, Allen R. Hefner: On-chip electrostatic discharge protection for CMOS gas sensor systems-on-a-chip (SoC). Microelectronics Reliability 46(8): 1285-1294 (2006)
2005
9EEJavier A. Salcedo, Juin J. Liou, Muhammad Yaqub Afridi, Allen R. Hefner: Novel electrostatic discharge protection structure for a monolithic gas sensor systems-on-a-chip. ISCAS (1) 2005: 416-419
8EEC. S. Ho, Kuo-Yin Huang, Ming Tang, Juin J. Liou: An analytical threshold voltage model of NMOSFETs with hot-carrier induced interface charge effect. Microelectronics Reliability 45(7-8): 1144-1149 (2005)
2003
7EEXiaofang Gao, Juin J. Liou, Joe Bernier, Gregg Croft, Waisum Wong, Satya Vishwanathan: Optimization of on-chip ESD protection structures for minimal parasitic capacitance. Microelectronics Reliability 43(5): 725-733 (2003)
2002
6EEXiaofang Gao, Juin J. Liou, Joe Bernier, Gregg Croft, Adelmo Ortiz-Conde: Implementation of a comprehensive and robust MOSFET model in cadence SPICE for ESD applications. IEEE Trans. on CAD of Integrated Circuits and Systems 21(12): 1497-1502 (2002)
5EEJuin J. Liou, R. Shireen, Adelmo Ortiz-Conde, F. J. García Sánchez, Antonio Cerdeira, Xiaofang Gao, Xuecheng Zou, C. S. Ho: Influence of polysilicon-gate depletion on the subthreshold behavior of submicron MOSFETs. Microelectronics Reliability 42(3): 343-347 (2002)
4EEAdelmo Ortiz-Conde, F. J. García Sánchez, Juin J. Liou, Antonio Cerdeira, Magali Estrada, Y. Yue: A review of recent MOSFET threshold voltage extraction methods. Microelectronics Reliability 42(4-5): 583-596 (2002)
3EEJuin J. Liou, Qiang Zhang, John McMacken, J. Ross Thomson, Kevin Stiles, Paul Layman: Statistical modeling of MOS devices for parametric yield prediction. Microelectronics Reliability 42(4-5): 787-795 (2002)
2001
2EEF. Schwierz, Juin J. Liou: Semiconductor devices for RF applications: evolution and current status. Microelectronics Reliability 41(2): 145-168 (2001)
1994
1EEW. W. Wong, Juin J. Liou: JFET circuit simulation using SPICE implemented with an improved model. IEEE Trans. on CAD of Integrated Circuits and Systems 13(1): 105-109 (1994)

Coauthor Index

1Muhammad Yaqub Afridi [9] [10]
2Joe Bernier [6] [7]
3Antonio Cerdeira [4] [5]
4Tsung-Min Chang [11]
5Gregg Croft [6] [7]
6Magali Estrada [4]
7Xiaofang Gao [5] [6] [7]
8Allen R. Hefner [9] [10]
9C. S. Ho [5] [8]
10Kuo-Yin Huang [8]
11Paul Layman [3]
12Shi-Tin Lin [11]
13John McMacken [3]
14Adelmo Ortiz-Conde [4] [5] [6]
15Javier A. Salcedo [9] [10]
16F. J. García Sánchez [4] [5]
17F. Schwierz [2]
18R. Shireen [5]
19Kevin Stiles [3]
20Ming Tang [8]
21J. Ross Thomson [3]
22Satya Vishwanathan [7]
23W. W. Wong [1]
24Waisum Wong [7]
25You-Lin Wu [11]
26Y. Yue [4]
27Qiang Zhang [3]
28Xuecheng Zou [5]

Colors in the list of coauthors

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)