| 2005 |
|---|
| 3 | EE | C. S. Ho,
Kuo-Yin Huang,
Ming Tang,
Juin J. Liou:
An analytical threshold voltage model of NMOSFETs with hot-carrier induced interface charge effect.
Microelectronics Reliability 45(7-8): 1144-1149 (2005) |
| 2002 |
|---|
| 2 | EE | Juin J. Liou,
R. Shireen,
Adelmo Ortiz-Conde,
F. J. García Sánchez,
Antonio Cerdeira,
Xiaofang Gao,
Xuecheng Zou,
C. S. Ho:
Influence of polysilicon-gate depletion on the subthreshold behavior of submicron MOSFETs.
Microelectronics Reliability 42(3): 343-347 (2002) |
| 1999 |
|---|
| 1 | EE | J. S. Chou,
C. S. Ho:
A fuzzy-ART-enhanced neural classifier.
KES 1999: 488-491 |
