| 2007 |
|---|
| 5 | EE | Jung Hwan Choi,
Jayathi Murthy,
Kaushik Roy:
The effect of process variation on device temperature in FinFET circuits.
ICCAD 2007: 747-751 |
| 4 | EE | Jung Hwan Choi,
Aditya Bansal,
Mesut Meterelliyoz,
Jayathi Murthy,
Kaushik Roy:
Self-Consistent Approach to Leakage Power and Temperature Estimation to Predict Thermal Runaway in FinFET Circuits.
IEEE Trans. on CAD of Integrated Circuits and Systems 26(11): 2059-2068 (2007) |
| 2006 |
|---|
| 3 | EE | Aditya Bansal,
Mesut Meterelliyoz,
Siddharth Singh,
Jung Hwan Choi,
Jayathi Murthy,
Kaushik Roy:
Compact thermal models for estimation of temperature-dependent power/performance in FinFET technology.
ASP-DAC 2006: 237-242 |
| 2 | EE | Jung Hwan Choi,
Aditya Bansal,
Mesut Meterelliyoz,
Jayathi Murthy,
Kaushik Roy:
Leakage power dependent temperature estimation to predict thermal runaway in FinFET circuits.
ICCAD 2006: 583-586 |
| 1 | | Lin Sun,
Chinh Le,
Faisal Saied,
Jayathi Murthy:
A Highly Scalable Simulation Model for Atomistic Calculation of Thermal Properties of Silicon.
PDPTA 2006: 306-312 |
