| |
| 2005 | ||
|---|---|---|
| 2 | EE | F. Cacchione, A. Corigliano, B. De Masi, C. Riva: Out of plane vs in plane flexural behaviour of thin polysilicon films: Mechanical characterization and application of the Weibull approach. Microelectronics Reliability 45(9-11): 1758-1763 (2005) |
| 2001 | ||
| 1 | EE | D. Brazzelli, G. Ghidini, C. Riva: Optimization of WSi2 by SiH4 CVD: impact on oxide quality. Microelectronics Reliability 41(7): 1003-1006 (2001) |
| 1 | D. Brazzelli | [1] |
| 2 | F. Cacchione | [2] |
| 3 | A. Corigliano | [2] |
| 4 | G. Ghidini | [1] |
| 5 | B. De Masi | [2] |