| 2008 |
|---|
| 10 | EE | Likun Xia,
Ian M. Bell,
Antony Wilkinson:
A novel approach for automated model generation.
ISCAS 2008: 504-507 |
| 2007 |
|---|
| 9 | EE | J. M. Gilbert,
Ian M. Bell:
The Effectiveness of Test in Controlling Quality Costs: A Conformability Analysis Based Approach.
J. Electronic Testing 23(4): 293-307 (2007) |
| 2004 |
|---|
| 8 | EE | Stephen J. Spinks,
Chris D. Chalk,
Ian M. Bell,
Mark Zwolinski:
Generation and Verification of Tests for Analog Circuits Subject to Process Parameter Deviations.
J. Electronic Testing 20(1): 11-23 (2004) |
| 2002 |
|---|
| 7 | EE | J. M. Gilbert,
Ian M. Bell,
D. R. Johnson:
Design, Manufacture and Test - Quality Test Estimation.
ISQED 2002: 200-205 |
| 1997 |
|---|
| 6 | EE | Stephen J. Spinks,
Chris D. Chalk,
Ian M. Bell,
Mark Zwolinski:
Generation and Verification of Tests for Analogue Circuits Subject to Process Parameter Deviations.
DFT 1997: 100-109 |
| 5 | | Osama K. Abu-Shahla,
Ian M. Bell:
An On-Line Self-Testing Switched-Current Integrator.
ITC 1997: 463-470 |
| 4 | EE | S. Yu,
B. W. Jervis,
Kevin R. Eckersall,
Ian M. Bell:
Diagnosis of CMOS op-amps with gate oxide short faults using multilayer perceptrons.
IEEE Trans. on CAD of Integrated Circuits and Systems 16(8): 930-935 (1997) |
| 1996 |
|---|
| 3 | EE | José Machado da Silva,
José Silva Matos,
Ian M. Bell,
Gaynor E. Taylor:
Mixed current/voltage observation towards effective testing of analog and mixed-signal circuits.
J. Electronic Testing 9(1-2): 75-88 (1996) |
| 1995 |
|---|
| 2 | | Ian M. Bell,
Kevin R. Eckersall,
Stephen J. Spinks,
Gaynor E. Taylor:
Fault Orientated Test and Fault Simulation of Mixed Signal Integrated Circuits.
ISCAS 1995: 389-392 |
| 1 | | Geir E. Sæther,
Chris Toumazou,
Gaynor E. Taylor,
Kevin R. Eckersall,
Ian M. Bell:
Concurrent Self Test of Switched Current Circuits Based on the S2I-Technique.
ISCAS 1995: 841-844 |
