Stephen J. Spinks

2004
3	EE	Stephen J. Spinks, Chris D. Chalk, Ian M. Bell, Mark Zwolinski: Generation and Verification of Tests for Analog Circuits Subject to Process Parameter Deviations. J. Electronic Testing 20(1): 11-23 (2004)
1997
2	EE	Stephen J. Spinks, Chris D. Chalk, Ian M. Bell, Mark Zwolinski: Generation and Verification of Tests for Analogue Circuits Subject to Process Parameter Deviations. DFT 1997: 100-109
1995
1		Ian M. Bell, Kevin R. Eckersall, Stephen J. Spinks, Gaynor E. Taylor: Fault Orientated Test and Fault Simulation of Mixed Signal Integrated Circuits. ISCAS 1995: 389-392

Coauthor Index

1	Ian M. Bell	[1] [2] [3]
2	Chris D. Chalk	[2] [3]
3	Kevin R. Eckersall	[1]
4	Gaynor E. Taylor	[1]
5	Mark Zwolinski	[2] [3]