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| 1997 | ||
|---|---|---|
| 1 | EE | S. Yu, B. W. Jervis, Kevin R. Eckersall, Ian M. Bell: Diagnosis of CMOS op-amps with gate oxide short faults using multilayer perceptrons. IEEE Trans. on CAD of Integrated Circuits and Systems 16(8): 930-935 (1997) |
| 1 | Ian M. Bell | [1] |
| 2 | Kevin R. Eckersall | [1] |
| 3 | S. Yu | [1] |