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Chris D. Chalk

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2004
3EEStephen J. Spinks, Chris D. Chalk, Ian M. Bell, Mark Zwolinski: Generation and Verification of Tests for Analog Circuits Subject to Process Parameter Deviations. J. Electronic Testing 20(1): 11-23 (2004)
2000
2EEZheng Rong Yang, Mark Zwolinski, Chris D. Chalk, Alan Christopher Williams: Applying a robust heteroscedastic probabilistic neural network toanalog fault detection and classification. IEEE Trans. on CAD of Integrated Circuits and Systems 19(1): 142-151 (2000)
1997
1EEStephen J. Spinks, Chris D. Chalk, Ian M. Bell, Mark Zwolinski: Generation and Verification of Tests for Analogue Circuits Subject to Process Parameter Deviations. DFT 1997: 100-109

Coauthor Index

1Ian M. Bell [1] [3]
2Stephen J. Spinks [1] [3]
3Alan Christopher Williams [2]
4Zheng Rong Yang [2]
5Mark Zwolinski [1] [2] [3]

Copyright © Sun May 17 03:24:02 2009 by Michael Ley (ley@uni-trier.de)