Chris D. Chalk

List of publications from the DBLP Bibliography Server - FAQ

2004

3 EE Stephen J. Spinks, Chris D. Chalk, Ian M. Bell, Mark Zwolinski: Generation and Verification of Tests for Analog Circuits Subject to Process Parameter Deviations. J. Electronic Testing 20(1): 11-23 (2004)

2000

2 EE Zheng Rong Yang, Mark Zwolinski, Chris D. Chalk, Alan Christopher Williams: Applying a robust heteroscedastic probabilistic neural network toanalog fault detection and classification. IEEE Trans. on CAD of Integrated Circuits and Systems 19(1): 142-151 (2000)

1997

1 EE Stephen J. Spinks, Chris D. Chalk, Ian M. Bell, Mark Zwolinski: Generation and Verification of Tests for Analogue Circuits Subject to Process Parameter Deviations. DFT 1997: 100-109

2004
3	EE	Stephen J. Spinks, Chris D. Chalk, Ian M. Bell, Mark Zwolinski: Generation and Verification of Tests for Analog Circuits Subject to Process Parameter Deviations. J. Electronic Testing 20(1): 11-23 (2004)
2000
2	EE	Zheng Rong Yang, Mark Zwolinski, Chris D. Chalk, Alan Christopher Williams: Applying a robust heteroscedastic probabilistic neural network toanalog fault detection and classification. IEEE Trans. on CAD of Integrated Circuits and Systems 19(1): 142-151 (2000)
1997
1	EE	Stephen J. Spinks, Chris D. Chalk, Ian M. Bell, Mark Zwolinski: Generation and Verification of Tests for Analogue Circuits Subject to Process Parameter Deviations. DFT 1997: 100-109

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