| |
| 2005 | ||
|---|---|---|
| 1 | EE | S. Huyghe, L. Béchou, N. Zerounian, Y. Deshayes, F. Aniel, A. Denolle, D. Laffitte, J. L. Goudard, Y. Danto: Electroluminescence spectroscopy for reliability investigations of 1.55 mum bulk semiconductor optical amplifier. Microelectronics Reliability 45(9-11): 1593-1599 (2005) |
| 1 | F. Aniel | [1] |
| 2 | L. Béchou | [1] |
| 3 | Y. Danto | [1] |
| 4 | A. Denolle | [1] |
| 5 | Y. Deshayes | [1] |
| 6 | J. L. Goudard | [1] |
| 7 | S. Huyghe | [1] |
| 8 | D. Laffitte | [1] |