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| 2003 | ||
|---|---|---|
| 1 | EE | J.-Y. Delétage, F. J.-M. Verdier, B. Plano, Y. Deshayes, L. Béchou, Y. Danto: Reliability estimation of BGA and CSP assemblies using degradation law model and technological parameters deviations. Microelectronics Reliability 43(7): 1137-1144 (2003) |
| 1 | L. Béchou | [1] |
| 2 | Y. Danto | [1] |
| 3 | J.-Y. Delétage | [1] |
| 4 | Y. Deshayes | [1] |
| 5 | B. Plano | [1] |