| 2003 |
|---|
| 4 | EE | Y. Deshayes,
L. Béchou,
J.-Y. Delétage,
F. Verdier,
Y. Danto,
D. Laffitte,
J. L. Goudard:
Three-dimensional FEM simulations of thermomechanical stresses in 1.55 mum Laser modules.
Microelectronics Reliability 43(7): 1125-1136 (2003) |
| 3 | EE | L. Mendizabal,
Jean-Louis Verneuil,
L. Béchou,
Christelle Aupetit-Berthelemot,
Y. Deshayes,
F. Verdier,
Jean-Michel Dumas,
Y. Danto,
D. Laffitte,
J. L. Goudard:
Impact of 1.55 mum laser diode degradation laws on fibre optic system performances using a system simulator.
Microelectronics Reliability 43(9-11): 1743-1749 (2003) |
| 2001 |
|---|
| 2 | | B. Lambert,
N. Malbert,
N. Labat,
F. Verdier,
A. Touboul,
P. Huguet,
R. Bonnet,
G. Pataut:
Evolution of LF noise in Power PHEMT's submitted to RF and DC Step Stresses.
Microelectronics Reliability 41(9-10): 1573-1578 (2001) |
| 2000 |
|---|
| 1 | EE | F. Verdier,
Alain Mérigot,
Bertrand Zavidovique:
Fast Stable Matching Algorithm using Asynchronous Parallel Programming Model.
CAMP 2000: 131-135 |
