1991 |
4 | EE | André Ivanov,
Corot W. Starke,
Vinod K. Agarwal,
Wilfried Daehn,
Matthias Gruetzner,
Tom W. Williams:
Iterative algorithms for computing aliasing probabilities.
IEEE Trans. on CAD of Integrated Circuits and Systems 10(2): 260-265 (1991) |
1988 |
3 | | Matthias Gruetzner:
Design for Testability for Wafer-Scale Integration Interconnect Systems Design and Test Methodology.
ITC 1988: 146-152 |
2 | EE | Tom W. Williams,
Wilfried Daehn,
Matthias Gruetzner,
Corot W. Starke:
Bounds and analysis of aliasing errors in linear feedback shift registers.
IEEE Trans. on CAD of Integrated Circuits and Systems 7(1): 75-83 (1988) |
1986 |
1 | | Tom W. Williams,
Wilfried Daehn,
Matthias Gruetzner,
Corot W. Starke:
Comparison of Aliasing Errors for Primitive and Non-Primitive Polynomials.
ITC 1986: 282-289 |