2001 | ||
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1 | B. Lambert, N. Malbert, N. Labat, F. Verdier, A. Touboul, P. Huguet, R. Bonnet, G. Pataut: Evolution of LF noise in Power PHEMT's submitted to RF and DC Step Stresses. Microelectronics Reliability 41(9-10): 1573-1578 (2001) |
1 | R. Bonnet | [1] |
2 | P. Huguet | [1] |
3 | N. Labat | [1] |
4 | B. Lambert | [1] |
5 | N. Malbert | [1] |
6 | A. Touboul | [1] |
7 | F. Verdier | [1] |