| |
| 2002 | ||
|---|---|---|
| 2 | EE | N. Labat, N. Malbert, B. Lambert, A. Touboul, F. Garat, B. Proust: Degradation mechanisms induced by thermal and bias stresses in InP HEMTs. Microelectronics Reliability 42(9-11): 1575-1580 (2002) |
| 2001 | ||
| 1 | B. Lambert, N. Malbert, N. Labat, F. Verdier, A. Touboul, P. Huguet, R. Bonnet, G. Pataut: Evolution of LF noise in Power PHEMT's submitted to RF and DC Step Stresses. Microelectronics Reliability 41(9-10): 1573-1578 (2001) | |
| 1 | R. Bonnet | [1] |
| 2 | F. Garat | [2] |
| 3 | P. Huguet | [1] |
| 4 | N. Labat | [1] [2] |
| 5 | N. Malbert | [1] [2] |
| 6 | G. Pataut | [1] |
| 7 | B. Proust | [2] |
| 8 | A. Touboul | [1] [2] |
| 9 | F. Verdier | [1] |